ČSN EN 62415 (358771)

Semiconductor devices - Constant current electromigration test (IEC 62415:2010)

STANDARD published on 1.12.2010

The information about the standard:

Designation standards: ČSN EN 62415
Classification mark: 358771
Catalog number: 87220
Publication date standards: 1.12.2010
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Czech technical standard
Category: Technical standards ČSN