ČSN EN 62417 (358769)

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)

STANDARD published on 1.12.2010

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Print design (9.50 USD)

The information about the standard:

Designation standards: ČSN EN 62417
Classification mark: 358769
Catalog number: 87218
Publication date standards: 1.12.2010
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: Czech technical standard
Category: Technical standards ČSN