ČSN EN 62418 (358772)

Semiconductor devices - Metallization stress void test (IEC 62418:2010)

STANDARD published on 1.1.2011

The information about the standard:

Designation standards: ČSN EN 62418
Classification mark: 358772
Catalog number: 87502
Publication date standards: 1.1.2011
The number of pages: 44
Approximate weight : 132 g (0.29 lbs)
Country: Czech technical standard
Category: Technical standards ČSN