ČSN EN IEC 62276-ed.4 (358417)

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

STANDARD published on 1.10.2025

The information about the standard:

Designation standards: ČSN EN IEC 62276-ed.4
Classification mark: 358417
Catalog number: 521961
Publication date standards: 1.10.2025
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

Annotation of standard text ČSN EN IEC 62276-ed.4 (358417):

This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators