Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
STANDARD published on 1.9.2025
Designation standards: ČSN EN IEC 63185-ed.2
Classification mark: 353012
Catalog number: 521811
Publication date standards: 1.9.2025
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
This document relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis