DIN 50455-2:1999-11

Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists.

STANDARD published on 1.11.1999

English -
PDF - Immediate download (50.40 USD)

English -

Print design (64.30 USD)

German -

PDF - Immediate download (40.10 USD)

German -

Print design (51.60 USD)

The information about the standard:

Designation standards: DIN 50455-2:1999-11
Publication date standards: 1.11.1999
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN 50455-2:1999-11 :

Prüfung von Materialien für die Halbleitertechnologie - Verfahren zur Charakterisierung von Fotolacken - Teil 2: Bestimmung der Lichtempfindlichkeit von Positiv-Fotolacken.