DIN EN 60749:2000-02

Semiconductor devices - Mechanical and climatic test methods.

STANDARD published on 1.2.2000

German -
PDF - Immediate download (137.10 USD)

The information about the standard:

Designation standards: DIN EN 60749:2000-02
Note: WITHDRAWN
Publication date standards: 1.2.2000
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749:2000-02 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren.