DIN EN 60749-30:2005-06

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing.

STANDARD published on 1.6.2005

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The information about the standard:

Designation standards: DIN EN 60749-30:2005-06
Note: WITHDRAWN
Publication date standards: 1.6.2005
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-30:2005-06 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen.