
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling.
STANDARD published on 1.10.2004
Designation standards: DIN EN 60749-34:2004-10
Note: WITHDRAWN
Publication date standards: 1.10.2004
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34: Lastwechselprüfung.