DIN EN 60749-37:2008-08

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer.

STANDARD published on 1.8.2008

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The information about the standard:

Designation standards: DIN EN 60749-37:2008-08
Note: WITHDRAWN
Publication date standards: 1.8.2008
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-37:2008-08 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 37: Prüfverfahren Fall der Leiterplatte unter Verwendung eines Beschleunigungs-Messgerätes.