DIN EN 60749-4:2017-11

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST).

STANDARD published on 1.11.2017

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The information about the standard:

Designation standards: DIN EN 60749-4:2017-11
Publication date standards: 1.11.2017
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-4:2017-11 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 4: Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST).