DIN EN 60749-6:2017-11

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature.

STANDARD published on 1.11.2017

The information about the standard:

Designation standards: DIN EN 60749-6:2017-11
Publication date standards: 1.11.2017
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: German technical standard
Category: Technical standards DIN