DIN EN 60749-10:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock.

STANDARD published on 1.4.2003

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The information about the standard:

Designation standards: DIN EN 60749-10:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-10:2003-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 10: Mechanisches Schocken.