Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure.
STANDARD published on 1.4.2003
Designation standards: DIN EN 60749-2:2003-04
Publication date standards: 1.4.2003
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck.