DIN EN 60749-23:2011-07

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

STANDARD published on 1.7.2011

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The information about the standard:

Designation standards: DIN EN 60749-23:2011-07
Publication date standards: 1.7.2011
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-23:2011-07 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.