Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling.
STANDARD published on 1.4.2004
Designation standards: DIN EN 60749-25:2004-04
Publication date standards: 1.4.2004
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 25: Zyklische Temperaturwechsel.