Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.
STANDARD published on 1.1.2012
Designation standards: DIN EN 60749-29:2012-01
Publication date standards: 1.1.2012
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.