Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection.
STANDARD published on 1.4.2003
Designation standards: DIN EN 60749-3:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 3: Äußere Sichtprüfung.