DIN EN 60749-35:2007-03

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components.

STANDARD published on 1.3.2007

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The information about the standard:

Designation standards: DIN EN 60749-35:2007-03
Publication date standards: 1.3.2007
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-35:2007-03 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 35: Ultraschallmikroskopie für kunststoffverkappte Bauelemente der Elektronik.