DIN EN 60749-38:2008-10

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory.

STANDARD published on 1.10.2008

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The information about the standard:

Designation standards: DIN EN 60749-38:2008-10
Publication date standards: 1.10.2008
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-38:2008-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher.