DIN EN 60749-4:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST).

STANDARD published on 1.4.2003

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The information about the standard:

Designation standards: DIN EN 60749-4:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-4:2003-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 4: Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST).