DIN EN 60749-5:2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test.

STANDARD published on 1.9.2003

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The information about the standard:

Designation standards: DIN EN 60749-5:2003-09
Note: WITHDRAWN
Publication date standards: 1.9.2003
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 60749-5:2003-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung.