DIN EN 60749-6:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature.

STANDARD published on 1.4.2003

The information about the standard:

Designation standards: DIN EN 60749-6:2003-04
Note: WITHDRAWN
Publication date standards: 1.4.2003
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN