DIN EN 62415:2010-12

Semiconductor devices - Constant current electromigration test.

STANDARD published on 1.12.2010

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The information about the standard:

Designation standards: DIN EN 62415:2010-12
Publication date standards: 1.12.2010
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN 62415:2010-12 :

Halbleiterbauelemente - Konstantstrom-Prüfverfahren zur Elektromigration.