DIN EN IEC 60749-28:2024-12

VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.

STANDARD published on 1.12.2024

German -
Print design (151.30 USD)

The information about the standard:

Designation standards: DIN EN IEC 60749-28:2024-12
Publication date standards: 1.12.2024
The number of pages: 51
Approximate weight : 153 g (0.34 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN IEC 60749-28:2024-12 :

VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.