DIN EN IEC 60749-34-1:2026-07

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module.

STANDARD published on 1.7.2026

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The information about the standard:

Designation standards: DIN EN IEC 60749-34-1:2026-07
Note: WITHDRAWN
Publication date standards: 1.7.2026
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN EN IEC 60749-34-1:2026-07 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34-1: Leistungszyklusprüfung für Leistungshalbleitermodule.