DIN IEC 60749:1987-09

Semiconductor devices; mechanical and climatic test methods; identical with IEC 60749, edition 1984.

STANDARD published on 1.9.1987

German -
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The information about the standard:

Designation standards: DIN IEC 60749:1987-09
Note: WITHDRAWN
Publication date standards: 1.9.1987
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN IEC 60749:1987-09 :

Halbleiterbauelemente; Mechanische und klimatische Prüfverfahren.