DIN SPEC 52407:2015-03

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM).

STANDARD published on 1.3.2015

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The information about the standard:

Designation standards: DIN SPEC 52407:2015-03
Publication date standards: 1.3.2015
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text DIN SPEC 52407:2015-03 :

Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM).