
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Aluminium (Al), Arsenic (As), Barium (Ba), Beryllium (Be), Bismuth (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chromium (Cr), Copper (Cu), Iron (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Potassium (K), Lithium (Li), Magnesium (Mg), Manganese (Mn), Molybdenum (Mo), Nickel (Ni), Niobium (Nb), Lead (Pb), Antimony (Sb), Tin (Sn), Strontium (Sr), Tantalum (Ta), Titani...
STANDARD published on 1.11.2012
Designation standards: E DIN 50451-3:2012-11
Note: WITHDRAWN
Publication date standards: 1.11.2012
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 3: Aluminium (Al), Arsen (As), Barium (Ba), Beryllium (Be), Bismut (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chrom (Cr), Kupfer (Cu), Eisen (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Kalium (K), Lithium (Li), Magnesium (Mg), Mangan (Mn), Molybdän (Mo), Nickel (Ni), Niob (Nb), Blei (Pb), Antimon (Sb), Zinn (Sn), Strontium (Sr), Tantal (Ta), Titan (Ti), Vanadium ...