E DIN EN 60749-29:2009-11

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.

STANDARD published on 1.11.2009

The information about the standard:

Designation standards: E DIN EN 60749-29:2009-11
Note: WITHDRAWN
Publication date standards: 1.11.2009
The number of pages: 45
Approximate weight : 135 g (0.30 lbs)
Country: German technical standard
Category: Technical standards DIN