E DIN EN 60749-29:2002-09

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.

STANDARD published on 1.9.2002

English and German -
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The information about the standard:

Designation standards: E DIN EN 60749-29:2002-09
Note: WITHDRAWN
Publication date standards: 1.9.2002
The number of pages: 33
Approximate weight : 99 g (0.22 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-29:2002-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.