E DIN EN 60749-30/A1:2009-10

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing.

STANDARD published on 1.10.2009

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The information about the standard:

Designation standards: E DIN EN 60749-30/A1:2009-10
Note: WITHDRAWN
Publication date standards: 1.10.2009
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-30/A1:2009-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen.