E DIN EN 60749-4:2016-06

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST).

STANDARD published on 1.6.2016

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The information about the standard:

Designation standards: E DIN EN 60749-4:2016-06
Note: WITHDRAWN
Publication date standards: 1.6.2016
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-4:2016-06 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 4: Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST).