E DIN EN 60749-41:2017-04

Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices.

STANDARD published on 1.4.2017

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The information about the standard:

Designation standards: E DIN EN 60749-41:2017-04
Note: WITHDRAWN
Publication date standards: 1.4.2017
The number of pages: 35
Approximate weight : 105 g (0.23 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-41:2017-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Zuverlässigkeitsprüfverfahren für nichtflüchtige Speicher-Bauelemente.