E DIN EN 60749-5:2016-12

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test.

STANDARD published on 1.12.2016

German -
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German -

Print design (95.00 USD)

The information about the standard:

Designation standards: E DIN EN 60749-5:2016-12
Note: WITHDRAWN
Publication date standards: 1.12.2016
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-5:2016-12 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung.