E DIN EN 60749-6:2016-09

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature.

STANDARD published on 1.9.2016

English and German -
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The information about the standard:

Designation standards: E DIN EN 60749-6:2016-09
Note: WITHDRAWN
Publication date standards: 1.9.2016
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-6:2016-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur.