
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking.
STANDARD published on 1.9.2016
Designation standards: E DIN EN 60749-9:2016-09
Note: WITHDRAWN
Publication date standards: 1.9.2016
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 9: Beständigkeit der Kennzeichnung.