E DIN EN 62047-14:2010-10

Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials.

STANDARD published on 1.10.2010

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The information about the standard:

Designation standards: E DIN EN 62047-14:2010-10
Note: WITHDRAWN
Publication date standards: 1.10.2010
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 62047-14:2010-10 :

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 14: Verfahren zur Ermittlung der Grenzformänderung metallischer Dünnschichtwerkstoffe.