E DIN EN 60749-28:2012-07

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM).

STANDARD published on 1.7.2012

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The information about the standard:

Designation standards: E DIN EN 60749-28:2012-07
Note: WITHDRAWN
Publication date standards: 1.7.2012
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-28:2012-07 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Direct Contact Charged Device Model (DC-CDM).