E DIN EN 60749-43:2013-10

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan.

STANDARD published on 1.10.2013

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The information about the standard:

Designation standards: E DIN EN 60749-43:2013-10
Note: WITHDRAWN
Publication date standards: 1.10.2013
The number of pages: 63
Approximate weight : 189 g (0.42 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-43:2013-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 43: Leitfaden zur Planung der Zuverlässigkeitsqualifikation von integrierten Schaltungen.