E DIN EN 60749-44:2014-08

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.

STANDARD published on 1.8.2014

English and German -
electronic design (pdf) (106.80 USD)

English and German -

Print design (129.10 USD)

English and German -

CD-ROM (108.40 USD)

The information about the standard:

Designation standards: E DIN EN 60749-44:2014-08
Note: WITHDRAWN
Publication date standards: 1.8.2014
The number of pages: 33
Approximate weight : 99 g (0.22 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN 60749-44:2014-08 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen.