NORMSERVIS s.r.o.

E DIN EN IEC 60749-23:2025-10

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

STANDARD published on 1.10.2025

English and German -
PDF - Immediate download (79.00 USD)
English and German -
Print design (98.60 USD)

The information about the standard:

Designation standards: E DIN EN IEC 60749-23:2025-10
Publication date standards: 1.10.2025
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN IEC 60749-23:2025-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.