E DIN EN IEC 60749-5:2024-04

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test.

STANDARD published on 1.4.2024

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The information about the standard:

Designation standards: E DIN EN IEC 60749-5:2024-04
Note: WITHDRAWN
Publication date standards: 1.4.2024
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN IEC 60749-5:2024-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung.