E DIN EN IEC 63287-2:2022-06

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile.

STANDARD published on 1.6.2022

English and German -
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The information about the standard:

Designation standards: E DIN EN IEC 63287-2:2022-06
Note: WITHDRAWN
Publication date standards: 1.6.2022
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN IEC 63287-2:2022-06 :

Halbleiterbauelemente - Richtlinien für Zuverlässigkeitsqualifizierungspläne - Teil 2: Konzept des Einsatzprofils.