E DIN EN IEC 63616:2026-07

VDE 0887-969-73. Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method.

STANDARD published on 1.7.2026

German -
Print design (26.70 USD)

The information about the standard:

Designation standards: E DIN EN IEC 63616:2026-07
Publication date standards: 1.7.2026
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN EN IEC 63616:2026-07 :

VDE 0887-969-73. Messung der Leitfähigkeit von Metalldünnschichten bei Mikrowellen- und Millimeterwellenfrequenzen nach dem symmetrischen Kreisscheibenresonatorverfahren.