E DIN IEC 60749-28:2003-02

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM).

STANDARD published on 1.2.2003

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The information about the standard:

Designation standards: E DIN IEC 60749-28:2003-02
Note: WITHDRAWN
Publication date standards: 1.2.2003
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN IEC 60749-28:2003-02 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD); Charged Device Model (CDM).