E DIN IEC 60749-33:2002-10

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance; Unbiased autoclave.

STANDARD published on 1.10.2002

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The information about the standard:

Designation standards: E DIN IEC 60749-33:2002-10
Note: WITHDRAWN
Publication date standards: 1.10.2002
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN IEC 60749-33:2002-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: Beschleunigte Feuchtebeständigkeit; Autoclave ohne Vorspannung.