E DIN IEC 60749-35:2004-12

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components.

STANDARD published on 1.12.2004

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The information about the standard:

Designation standards: E DIN IEC 60749-35:2004-12
Note: WITHDRAWN
Publication date standards: 1.12.2004
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN IEC 60749-35:2004-12 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 35: Ultraschallmikroskopie für kunststoffverkappte Bauelemente der Elektronik.