E DIN IEC 60749-38:2005-04

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error rate testing of electronic components.

STANDARD published on 1.4.2005

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The information about the standard:

Designation standards: E DIN IEC 60749-38:2005-04
Note: WITHDRAWN
Publication date standards: 1.4.2005
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN IEC 60749-38:2005-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Rate bei elektronischen Bauelementen.