
Bias-Temperature Stability Test for MOSFET.
STANDARD published on 1.9.2004
Designation standards: E DIN IEC 62373:2004-09
Note: WITHDRAWN
Publication date standards: 1.9.2004
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: German technical standard
Category: Technical standards DIN
Stabilität von MOSFET unter Temperatur-Spannungs-Beanspruchung.